Facilities
Structure Characterization
|
|
 |
 |
 |
|
GPC-MALLS Wyatt |
LC-MS Agilent6420 |
GC CP3900，Varian |
UV TU-1900，Persee |
|
|
 |
 |
 |
|
FTIR NEXUS，Nicolet |
AAS Z-2000，Hitachi |
XRF F-7000，Hitachi |
DSC TAM III，TA |
|
|
 |
 |
 |
|
DSC METTLER TOLEDO |
MicroDSC Ⅲ Setaram |
DVS Intrinsic SMS |
AKTA Prime Plus GE |
Colloid and Interface
|
|
 |
 |
 |
|
Zetasizer NanoZS Malvern |
Mastersizer 2000 Malvern |
Laser Particle Sizer BT-9300H，Better |
IPDI BT-1600，Better |
|
|
 |
 |
 |
|
Interfacial Rheometer TRACKER，TECLIS |
Brewster Angle Microscope Nanofilm_EP3 BAM |
Rotational Rheometer HAKKE RheoStress 6000 |
Texture Analyzer TMS-PRO，FTC |
Specimen Preparations
|
|
 |
 |
 |
|
Nano homogeneous Machine M-110L，Microfluidics |
Mulser PT2100，KINEMATICA |
Vacuum Freeze Drier ModulyoD-230，Thermo Savant |
Spray Drier B-290，BUCHI |
